Mark Identification
OPENSHORT
Serial Number
87917601
Filing Date
May 11, 2018
Registration Date
May 7, 2019
Trademark by
Active Trademark
Classification Information
Computer programs for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes; Computer programs and computer software for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes; data processing programs for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes
Electrical and Scientific Apparatus