OPENSHORT

Scientific and technological services, namely, analysis of defects in the image pattern and design layout pattern of electronic circuits, semiconductors, semiconductor wafers, integrated circuits, printed circuit boards, semiconductor packaging, LCD panels and solar panels by optical microscopes, electron beam microscopes or scanning electron microscopes; computer programming and software design for the analysis of defects in the image pattern and design layout pattern of electronic circuits, semiconductors, semiconductor wafers, integrated circuits, printed circuit boards, semiconductor packaging, LCD panels and solar panels by optical microscopes, electron beam microscopes or scanning electron microscopes; technical analysis of computer data to identify defects in the image pattern and design layout pattern of electronic circuits, semiconductors, semiconductor wafers, integrated circuits, printed circuit boards, semiconductor packaging, LCD panels and solar panels by optical microscopes, electron beam microscopes or scanning electron microscopes