OMNIPROBE

Analytical tools for use in energetic beam microscopes, namely, nano-manipulators, in-situ probe tip exchange tool, TEM and atom-probe sample preparation tool, gas injection tool, and sensitive-sample transfer tool; sample holders and probe-tip holders for use with the foregoing tools; application software for the operation of all the foregoing tools; consumable parts for the foregoing tools, namely, probe tips, lift-out grids for holding samples for electron microscope examination, and coupons in the nature of templates for making lift-out grids for the same