Mark Identification

ODP

Serial Number

78222793

Filing Date

Mar 7, 2003

Trademark by

TOKYO ELECTRON LIMITED

Classification Information

Optical digital measuring systems sold as a unit for measuring critical dimensions,profile and film thickness in semiconductor manufacturing, comprising, namely, an electric light source, a spectroscopic elipsometry, reflectometry, computer hardware, critical dimensions metrology software and, profile and thickness semiconductor measurement software

Electrical and Scientific Apparatus

Repair, installation and maintenance of measuring apparatus; repair, installation and maintenance of computers, including CPU and peripheral equipment

Building Construction and Repair

Consulting services relating to semiconductor manufacturing apparatus and flat panel display manufacturing apparatus; consulting services relating to operational and functional aspects of optical measuring machines and apparatus for measuring film thickness and size and shape of wafers, and for particle inspection; repair, installation and maintenance of computer programs and software

Computer and Scientific