NUFLARE

Measuring and testing machines and instruments, namely, temperature indicators, pressure gauges, electrical circuit testers; optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; testing apparatus for testing photomasks, namely, testing apparatus for inspecting defects in patterns on photomasks to be transferred to semiconductor wafers; testing apparatus for testing wafers, namely, testing apparatus for inspecting defects in patterns written on semiconductor wafers