NTEGRA

Nano technology instruments, namely, microscopes, measuring apparatus and measuring instruments, namely, atomic force microscopes, scanning probe microscopes, integrated atomic force microscopes and confocal Raman microscopes, integrated atomic force microscopes with interferometers for nano-IR infrared measurements, scanning tunneling microscopes, atomic force microscopes for electrochemical measurements, atomic force microscopes with external magnetic fields, atomic force microscopes for work in low vacuum, atomic force microscopes for quantitative nano-mechanical measurements, atomic force microscopes for qork in liquids, computers; downloadable computer software for control of atomic force microscopes systems, image acquisition, image in the field of chemistry, physics, biology, semiconductors, metrology, material science; electric apparatus and instruments, namely, atomic force microscopes, scanning probe microscopes, scanning tunneling microscopes, scanning confocal Raman microscopes; microscopes and parts thereof