79246209
Oct 4, 2018
Nov 5, 2019
Active Trademark
Computer hardware and software for the design and manufacture of semiconductor wafers and masks; metrology and inspection tools, namely, metrology and inspection computer hardware, micro-processors and electronic sensors for measuring, detecting and inspecting chemical compositions, temperature, light images, thickness, flatness, texture, line width and contamination of semiconductor wafers and masks during the manufacturing process; none of the foregoing in the field of fiber optics
Electrical and Scientific ApparatusServices of technical specialists in the area of metrology, namely, scientific research in the area of semiconductor manufacturing technology; technological services with reference to semiconductor lithography, namely, provision technical consultation in the field of placement techniques for Sub-Resolution Assist Features (SRAF) in order to improve the semiconductor manufacturing process; none of the foregoing in the field of fiber optics
Computer and Scientific