Mark Identification

NANOMETRICS

Serial Number

75145658

Filing Date

Jun 25, 1996

Registration Date

Apr 7, 1998

Trademark by

ONTO INNOVATION INC.

Active Trademark

Classification Information

scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology, for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials

Electrical and Scientific Apparatus