Mark Identification

NANOFOCUS

Serial Number

76440179

Filing Date

Aug 14, 2002

Registration Date

Sep 28, 2004

Trademark by

GE SENSING & INSPECTION TECHNOLOGIES GMBH

Classification Information

X-ray systems for non-destructive testing in science and industry, namely X-ray apparatus with image resolution in the micrometer and submicrometer or nanometer range, X-ray tubes with focal spots in the micrometer and submicrometer/nanometer range for non-destructive testing; image processing and control software for non-destructive testing with X-ray systems and X-ray tubes; image processing and control software for the X-ray analysis and inspection of medical, biological and pathological preparations and specimen

Electrical and Scientific Apparatus

Roentgen systems for analysis and inspection of medical, biological and pathological preparations and specimen, namely X-ray apparatus with image resolution in the micrometer and submicrometer/nanometer range, X-ray tubes with focal spots in the micrometer and submicrometer/nanometer range for analysis and inspection of medical, biological and pathological preparations and specimen

Medical Apparatus