Mark Identification
MIROVIEW
Serial Number
86480824
Filing Date
Dec 15, 2014
Registration Date
Apr 26, 2016
Trademark by
Active Trademark
Classification Information
Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)
Electrical and Scientific Apparatus