Mark Identification
MIRO
Serial Number
77558171
Filing Date
Aug 28, 2008
Registration Date
Jan 5, 2010
Trademark by
Classification Information
Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)
Electrical and Scientific Apparatus