MICRONICS JAPAN

Probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and integrated circuits; testing, inspection, and probing instruments, namely, semiconductor testing instruments for making electrical contact with probes to semiconductor devices for use in the process of manufacture, testing, and inspection of semiconductor devices and integrated circuit; probes for testing of integrated circuits and semiconductor devices; probe stations being a positioning apparatus for connecting probes to semiconductor device electrodes for testing and inspecting integrated circuits and semiconductor devices, namely, precision instruments for manipulation and positioning of microscopic objects; probes for scientific purposes for the measurement of electronic signals; electric contacts; electrical instruments, namely, sockets and socket terminal carriers being electrical terminal blocks

Repair or maintenance of probe cards for use in connection with inspection of semiconductor devices and integrated circuits; repair or maintenance of probe cards for testing integrated circuits and semiconductor devices