MICRONICS JAPAN

probe cards in the nature of semiconductor testing apparatus; apparatus for testing the electrical properties of semiconductors; apparatus for testing the magnetic properties of semiconductors; Integrated circuit measuring jigs for testing integrated circuits; apparatus for testing the performance of liquid crystal display (LCD) panels; inspection jigs for testing the performance of liquid crystal display(LCD) panels; electric contacts for measuring apparatus and instruments; testing apparatus for integrated circuits; structural and replacement parts for testing apparatus for integrated circuits; testing apparatus for organic light-emitting diodes (OLEDs); structural and replacement parts for testing apparatus for organic light-emitting diodes (OLEDs)

repair or maintenance of probe cards in the nature of semiconductor testing apparatus; repair or maintenance of apparatus for testing the electrical properties of semiconductors; repair or maintenance of apparatus for testing the magnetic properties of semiconductors; repair or maintenance of integrated circuit measuring jigs for testing integrated circuits; repair or maintenance of apparatus for testing the performance of liquid crystal display (LCD) panels; repair or maintenance of testing apparatus for integrated circuits; repair or maintenance of testing apparatus for organic light-emitting diodes (OLEDs)