MICRO-COMPOSITE MEMS

Probes for testing integrated circuits and semiconductor devices; probes for use in connection with inspection of semiconductor devices and integrated circuits; probes for the measurement of electronic signals; probes for inspecting integrated circuits and semiconductor devices; testing and inspecting apparatus for use in connection with semiconductors and integrated circuits; probes for scientific purposes

Custom manufacturing of probes for testing semiconductor devices, probes for testing integrated circuits, and probes for testing electronic signals; custom additive manufacturing of probes for others; custom 3-D printing for others

Custom design and engineering services of probes for use in testing integrated circuits and semiconductor devices; consulting services in the field of testing of electronic components and electronic systems; technical consulting services in the field of testing of electronic components and electronic systems