MATRICS

Semiconductor photomask optical inspection apparatus; semiconductor photomask imaging apparatus, namely, optical imaging apparatus for semiconductor photomask; semiconductor reticle optical inspection apparatus; semiconductor reticle imaging apparatus, namely, optical imaging apparatus for semiconductor reticle; semiconductor photomask blanks optical inspection apparatus; semiconductor photomask blanks imaging apparatus, namely, optical imaging apparatus for semiconductor photomask blanks; optical inspection apparatus for semi-conductor materials and elements; semi-conductor testing machines and instruments; electron microscopes; semiconductor defect detectors; material testing instruments and machines, namely, metal strength testing machines; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision measuring apparatus for defects of photomasks or reticles; data sets, recorded and downloadable, in the field of semiconductors; computer software, recorded, for operating semiconductor photomask or reticles optical inspection apparatus; computer software applications, downloadable, for operating semiconductor photomask or reticles optical inspection apparatus; computer hardware; computer programs, downloadable, for operating semiconductor photomask or reticles optical inspection apparatus