MAGICS

Optical inspection apparatus for semi-conductor materials and elements; semiconductor photomask optical inspection apparatus; imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomasks; semiconductor photomask blanks optical inspection apparatus; imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomask blanks; semiconductor wafer optical inspection apparatus; imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor wafer; semi-conductor testing machines and instruments; photomask blanks defect detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision measuring apparatus for defects of photomask blanks