LEENO

Sockets for testing semiconductors; probes for testing semiconductors; probe cards for testing semiconductors; electric connections, namely, electric sockets, plugs, and contacts for connecting electrical products, electrical components, integrated circuits, and printed circuit boards; testing apparatus not for medical purposes, namely, testing apparatus for testing electrical attributes of electrical products, electrical components, integrated circuits, and printed circuit boards; probes for scientific purposes, namely, probes for testing electrical attributes of electrical products, electrical components, integrated circuits, and printed circuit boards; measuring instruments, namely, jigs; electric measuring device, namely, technical measuring, testing and checking apparatus and instruments for measuring, testing and checking the electrical conduction and insulation, and electrical attributes of semiconductors, electrical products, electrical components, integrated circuits, and printed circuit boards; electric contacts; electric terminals, namely, electrical terminal blocks, electrical terminal boxes, electric connecting terminals, elastic electric connecting terminals, and electrical terminals for electrical connectors; electric control panels; printed circuit boards; testing apparatus for testing automotive electronic systems