86818669
Nov 12, 2015
Apr 17, 2018
Active Trademark
Computer hardware; semiconductor and wafer defect inspection systems; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; a feature of semiconductor and wafer defect inspection systems for improving the detection of defects on advanced logic and memory IC devices across a broad range of process layers
Electrical and Scientific Apparatus