J-PROBE

MEASURING APPARATUS, NAMELY, DEVICES AND INSTRUMENTS FOR THE MEASUREMENT OF VOLTAGE AND ELECTRIC CURRENT, VOLTMETERS, AMMETERS, VOLTAMMETERS, DEVICES FOR THE MEASUREMENT OF ELECTRICAL PROPERTIES AND CHARACTERISTICS OF SEMICONDUCTOR INTEGRATED CIRCUITS; INSTRUMENTS USED FOR THE INSPECTION AND EXAMINATION OF SEMICONDUCTOR INTEGRATED CIRCUITS; ELECTRONIC WIRE AND CABLE; APPARATUS FOR ELECTRONIC APPLICATIONS, NAMELY, CARDS USED FOR THE MEASUREMENT OF VOLTAGE AND ELECTRIC CURRENT, CARDS USED FOR THE INSPECTION AND EXAMINATION OF SEMICONDUCTOR INTEGRATED CIRCUITS, AND PARTS THEREFOR