INXIGHT

Measuring apparatus and instruments, namely X-ray apparatus not for medical purposes in the nature of x-ray radiography instruments, x-ray imaging instruments, x-ray scattering instruments; scientific apparatus and instruments, namely, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments, X-ray imaging instruments, x-ray scattering instruments, for examining material structures and particle size analysis; sensors for measuring distance to an object, not for medical use; laboratory apparatus and instruments, namely, X-ray apparatus not for medical purposes, optical time-domain reflectometers, X-ray imaging modules for X-ray apparatus not for medical purposes in the nature of X-ray scattering measurements, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments and X-ray imaging apparatus; measuring, regulating and testing apparatus, namely, x-ray fluorescence analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures and for analysis of the macrostructure of materials; apparatus and instruments for industrial process monitoring and control, namely, X-ray apparatus not for medical purposes in the nature of X-ray scattering instruments; structural parts and fittings for the above goods; downloadable software for scientific applications, in particular for modelling the structure of nanomaterials and computer hardware; all of the aforesaid goods being specifically in connection with x-ray apparatus, in particular with x-ray radiography apparatus or x-ray imaging not for medical purposes, in particular in combination with small-angle x-ray scattering and/or wide-angle x-ray scattering; all of the aforesaid goods being specifically used for materials research, development or production control in the field of polymers, nanocomposites, biomaterials, alloys, in particular for analysis of the macrostructure at several microns to centimeter scale, in particular for detection of structural inhomogeneities, defects, voids, pores, aggregations, and interfaces in such materials