Mark Identification

INTEGRATED METROLOGY

Serial Number

76075179

Filing Date

Jun 22, 2000

Registration Date

Dec 3, 2002

Trademark by

ONTO INNOVATION INC.

Active Trademark

Classification Information

Thin film and wafer surface measurement and inspection products which are designed to fit inside or be mounted onto production equipment used in the manufacturing of integrated circuits, such as chemical mechanical polishers, chemical vapor deposition systems, and other related equipment

Electrical and Scientific Apparatus