Optical inspection apparatus for visually inspecting semiconductor wafers; Optical inspection apparatus for inspecting the appearance of semiconductor wafers; Inspection machines for the optical inspection of semiconductor wafers; Inspection machines for the optical inspection of the appearance of semiconductor wafers; Optical inspection apparatus for visually inspecting the glass substrates in rectangular shape of semiconductor; Optical inspection apparatus for inspecting the appearance of glass substrates in rectangular shape of semiconductor; Inspection machines for the optical inspection of glass substrates in rectangular shape of semiconductor; Inspection machines for the optical inspection of the appearance of glass substrates in rectangular shape of semiconductor
Electrical and Scientific Apparatus