Mark Identification

HIDRA VISION

Serial Number

79420136

Filing Date

Nov 7, 2024

Trademark by

NPL MANAGEMENT LIMITED

Classification Information

Treatment of semiconductor materials; treatment of waste semiconductor materials; treatment of electronic materials; treatment of optical materials; treatment of integrated circuit packaging materials; treatment of nanostructured materials; treatment of materials for quantum technologies; treatment of engineering materials; treatment of wafer surfaces; treatment of lithography masks; treatment of wafer bulk via doping, annealing, planarization, bonding and other fabrication processes; treatment of hazardous materials; treatment of thin and fragile materials; consultancy relating to the clearance of pollution.

Treatment of Materials

Imaging apparatus and instruments; detection apparatus and instruments; apparatus and instruments for generating an image of semi-conductors, semi-conductor wafers, electronic materials and electronic components; apparatus and instruments for testing or inspecting semi-conductors, semi-conductor wafers, electronic materials and electronic components; computer software, firmware and hardware for use in the generation of an image of semi-conductors, semi-conductor wafers, electronic materials and electronic components; computer software, firmware and hardware for use in testing or inspecting semi-conductors, semi-conductor wafers, electronic materials and electronic components; recorded and downloadable media having recorded thereon data relating to the imaging, testing or inspection of semi-conductors, semi-conductor wafers, electronic materials and electronic components; computer software, firmware and hardware including recorded data relating to the imaging, testing or inspection of semi-conductors, semi-conductor wafers, electronic materials and electronic components.

Electrical and Scientific Apparatus

Digital imaging services, not for medical purposes; remote sensing and earth observation, remote sensing and earth observation from space; digital imaging services relating to the imaging, testing or inspection of semi-conductors, semi-conductor wafers, electronic materials and electronic components; testing or inspection of semi-conductors, semi-conductor wafers, electronic materials and electronic components; material testing for fault detection; technical consulting in the field of pollution detection; soil testing services; quality control of building materials; monitoring of commercial and industrial sites for detection of volatile and non-volatile organic compounds; technical consultancy in the field of pollution detection; detection of leaks and draughts within buildings.

Computer and Scientific

Bomb detection services; camouflage detection.

Personal