HEATLET

Semiconductor testing apparatus; probes for testing semiconductors; microcontrollers; testing apparatus for electronic components, namely, testing apparatus for testing silicon wafers, printed circuit boards, integrated circuits, semiconductors, and network infrastructure in the nature of electric wiring, cords, connectors, and cables; downloadable computer software for use in processing semiconductor wafers; electronic liquid-level controllers for controlling the temperature of semiconductor wafers, printed circuit assemblies, integrated circuits, or semiconductors; electronic speed controllers; electrical controlling devices; automatic temperature control instruments; automatic liquid-level control instruments; automatic pressure control instruments; automatic speed control instruments; microprocessor control apparatus, namely, electronic control systems for microprocessors; microprocessor control apparatus, namely, microprocessor-based hardware systems used to control ethernet communications and power; electronic control apparatus for controlling industrial process machines, semiconductor wafers, printed circuit assemblies, integrated circuits and semiconductors; measurement devices for measuring bandwidth and network quality, connectivity, speed, and performance, namely, semiconductor wafers, printed circuit assemblies, integrated circuits and semiconductors; testing equipment in the nature of temperature controllers for controlling the temperature of semiconductor wafers, printed circuit assemblies, integrated circuits, or semiconductors for detecting flaws