GAIA

Imaging metrology tools, namely, scientific and electronic imaging instruments for inspecting and characterizing physical properties, including micro-bump arrays, of semiconductors, integrated circuits, and microelectronics, and their packaging; Computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, and microelectronics; Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, semiconductor panels, and their packaging; Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers, semiconductor panels, and their packaging