EXTED

Measuring or testing machines and instruments, namely, equipment and apparatus for use in measuring, analyzing and diagnosis of temperature and multifunctional equipment and apparatus for use in measuring, analyzing and diagnosis both of temperature and electronic signals in the fields of manufacturing or testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof, especially, Multi-channel Digital Recorder, namely, temperature indicators incorporating voltmeter; electronic and magnetic measuring and testing instruments, namely, equipment and apparatus for use in measuring, analyzing and diagnosis of electronic signals, optical signals and fundamental quantity of electricity, namely, current, voltage, impedance, frequency in the field of manufacturing or testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof, namely, digital multimeters equipped with DC voltage/Current Generators, spectrum analyzers, network analyzers, optical spectrum analyzers, optical network analyzers, optical time domain reflectmeters, frequency counters in the nature of meters and testers for measuring, analyzing and diagnosis of electronic signals, optical signals and fundamental quantity of electricity, pulse pattern generators, error detectors, protocol analyzers, digital spectrum analyzers, Bluetooth testers, namely, radio communication testers for use in the analyzing and testing of radio communications comprised of primarily mainframe consisting of display and optical units, and connecting cables, emitters, detectors, and transceiver modules, wave-form distortion analyzers, ratio meters, wave-noise figure meters, electronic instruments for testing bit error rates, and laser diode test systems, namely, meters and testers for use in the analyzing and testing of laser beam comprised of primarily mainframe consisting of display and optical units, light source for probe signal, and connecting cables, emitters, detectors, wave-form distortion analyzers, ratio meters, wave-noise figure meters, and electronic instruments for testing bit error rates; electronic machines and apparatus equipped with test handler for use in measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, and other semiconductor devices in the field of manufacturing or testing the foregoing, especially, LSI (Large Scale Integrated circuits) and VLSI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash memory Test System, RFIC (Radio Frequency Integrated circuits) Test System, mixed-signal test system, LCD (Liquid Crystal Display Driver) test system, image sensor test system, E-beam Test System; computer software for testing, measuring, analyzing, and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, and electronic components and assemblies composed thereof used in connection with applied electronic machines and apparatus, namely, LSI (Large Scale Integrated circuits) and VLSI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash memory Test System, RFIC (Radio Frequency Integrated circuits) Test System, Mixed-signal Test System, LCD (Liquid Crystal Display Driver) Test System, image sensor Test System, E-beam Test System; computer software recorded on magnetic, electromagnetic, and optical data carriers, namely, tapes, discs and chips for testing, measuring, analyzing, and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, and electronic components and assemblies composed thereof, pre-recorded video discs and video tapes featuring information in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, and electronic components and assemblies composed thereof