EPSILON

computer software for diffractometric analysis of materials; computer software for spectrometric analysis of materials; computer software for x-ray fluorescence analysis of materials; computer software for determining X-ray intensities; computer software for determining the thickness of layer samples; computer software for determining chemical composition of materials; computer software for standardless analysis of samples; none of the aforesaid goods being for use in the field of psychological testing; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analyzers; X-ray tubes; X-ray apparatus; computer software and hardware for X-ray diffraction and operating X-ray diffraction apparatus; spectrometers; component parts and fittings for all the aforesaid; none of the aforesaid goods being for medical purposes or for use in the field of psychological testing