EPMRS

Optical inspection apparatus for semi-conductor materials and elements; Semiconductor photomask optical inspection apparatus; semiconductor photomask imaging apparatus, namely, optical imaging apparatus for semiconductor photomask; semiconductor reticle optical inspection apparatus; semiconductor reticle imaging apparatus, namely, optical imaging apparatus for semiconductor reticle; semiconductor pellicle optical inspection apparatus; semiconductor pellicle imaging apparatus, namely, optical imaging apparatus for semiconductor pellicle; semi-conductor testing machines and instruments; electron microscopes; semiconductor defect detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision measuring apparatus for defects of photomasks, reticles or pellicles; data sets, downloadable, in the field of semiconductors; computer software, recorded, for operating semiconductor photomasks, reticles or pellicles inspection apparatus; computer software applications, downloadable, for operating semiconductor photomasks, reticles or pellicles inspection apparatus; computer hardware; computer programs, downloadable, for operating semiconductor photomasks, reticles or pellicles inspection apparatus