ENTROPE

Probes for scientific purposes; measuring or testing machines and instruments measuring electric noise of semi-conductor devices; probes for scientific purposes for measuring electric noise of semi-conductor devices; Downloadable and recorded computer programs for use in measuring or testing machines and instruments measuring electric noise of semi-conductor devices; Downloadable and recorded computer programs for use in probes for scientific purposes measuring electric noise of semi-conductor devices

Providing temporary use of non-downloadable computer programs on data networks for use in measuring or testing machines and instruments measuring electric noise of semi-conductor devices; providing temporary use of non-downloadable computer programs on data networks for use in probes for scientific purposes measuring electric noise of semi-conductor devices; computer software design, computer programming, and maintenance of computer software, namely, computer programming services for measuring and analysis of electric noise of semi-conductor devices; technical research or scientific laboratory services, namely, measuring and analysis of electric noise of semi-conductor devices