85886985
Mar 26, 2013
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Electrical and Scientific ApparatusProviding training services in the field of inspection and metrology tools for semiconductors, integrated circuits and microelectronics
Education and EntertainmentConsulting services in the field of yield management and product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries; providing information in the field of inspection, metrology and testing of the physical and electrical properties of semiconductors, integrated circuits and microelectronics
Computer and Scientific