Electron microscope; Electron microscope that can obtain images of sample located at atmospheric pressure or low vacuum; Parts of electron microscopes, namely, thin membranes used for an electron microscope to separate an inner vacuum space of the electron microscope from an outer atmosphere space in which a sample is placed; Electron microscope parts; X-ray apparatus, namely, Energy Dispersive X-ray Spectroscopy (EDS) apparatus; Microscope apparatus, namely, cross sectional polisher using ion beam for polishing a cross section of a specimen used for an electron microscope; Microscope and x-ray apparatus, namely, particle analysis device using an electron microscope and Energy Dispersive X-ray Spectroscopy (EDS) apparatus; Computer central processing units for processing information, data, sound or images; Computer operating programs, recorded; Downloadable computer programs using artificial intelligence (AI) for obtaining an image of a sample in an electron microscope
Electrical and Scientific Apparatus