EH

TAP-OFFS; ATTENUATORS; D.C. RESTORERS; AND MICROWAVE AMPLIFIERS

ELECTRONIC MEASURING (OR TESTING) DEVICES-NAMELY, PULSE GENERATORS, MARKER GENERATORS, TUNNEL DIODE PULSERS, RISE-TIME STANDARDS, PULSE TRANSFORMERS, RISE-TIME INTEGRATORS, SINGLE PULSE TRIGGERS, WORD GENERATORS, CURRENT SOURCES, TIMING UNITS; PULSE DRIVERS; MEMORY TEST SYSTEMS COMPRISING WORD GENERATORS, TIMING UNITS, PULSE DRIVERS, CURRENT SOURCES; VOLTMETERS, POWER SUPPLIES AND DISCRIMINATORS AND USED IN VARIOUS COMBINATIONS FOR TESTING PURPOSES; SWITCHING TIME TEST SYSTEMS FOR AUTOMATIC TESTING OF TRANSISTOR DIODES; DELAY LINES; SEMICONDUCTOR AND DYNAMIC TEST SYSTEMS FOR TESTING INTEGRATED CIRCUITS (BIPOLAR MOS, LST) TRANSISTOR DIODES AND OTHER PULSE AND LOGIC ELEMENTS-NAMELY, TIMING UNITS, PULSE DRIVERS CONTROL UNITS, AND RACK ASSEMBLY; STROBING VOLTMENTERS; ANALOG TO DIGITAL RECORDS-GENERATORS; DIGITAL/ANALOG CONVERTERS; AND MICROWAVE SWEPT OSCILLATORS AND TRANSISTOR MOUNTS FOR MEASUREMENT OF TRANSISTOR SWITCHING TIMES