EB SCOPE
Mark Identification

EB SCOPE

Serial Number

77147737

Filing Date

Apr 3, 2007

Trademark by

KABUSHIKI KAISHA TOPCON

Classification Information

Electronic measuring instruments for testing and analyzing semiconductor wafers

Electrical and Scientific Apparatus

Manufacture of electronic instruments for testing and analyzing semiconductor wafers, integrated circuits, and other electronic circuits

Treatment of Materials

Rental and leasing of instruments for analyzing and testing semiconductor wafer; Testing, evaluation, and research of instruments for analyzing and testing semiconductor wafers

Computer and Scientific