77532488
Jul 28, 2008
Jul 27, 2010
Computer software to enable small- and wide-angle x-ray scattering; scientific and industrial measuring apparatus for use in connection with small- and wide-angle x-ray scattering; analytical apparatus for use in connection with analyzing nanopowders and nano-composite materials; computer software for the operation and management of diffractometers and spectrometers; x-ray diffractometers; x-ray analysers; x-ray fluorescence spectrometers; wafer analysers; x-ray tubes; parts and fittings for all the aforesaid
Electrical and Scientific Apparatus