DOMINION MICROPROBES

Electronic testing equipment, namely, apparatus for testing semiconductor and micro-electronic devices and circuits; Electronic testing equipment, namely, probe stations for mounting probes and their components and accessories, namely, manual positioners, automated positioners and environmental chambers, all for testing integrated circuits and semiconductors; Probes for testing integrated circuits; Millimeter and sub-millimeter wavelength on-wafer ground-signal-ground probes, and associated components, for electrical measurement of integrated circuits and semiconductors; Probes and probe station for mounting probes, and their components and accessories namely, manual positioners, automated positioners and environmental chambers, all for on-wafer testing of integrated circuits