86386598
Sep 5, 2014
May 19, 2015
KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES
Active Trademark
Metrology software for use in the manufacturing of semiconductors; software for the evaluation and inspection of semiconductors and semiconductor materials; software for use in processing semiconductor wafers, software for analyzing, measuring, and contouring based on electron microscope images and data
Electrical and Scientific Apparatus