78459607
Jul 30, 2004
Nov 25, 2008
KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES
Active Trademark
[Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in semiconductor manufacturing and lithography; semiconductor and integrated circuit evaluation and inspection apparatus for use in semiconductor manufacturing, integrated circuit manufacturing, and lithography;] software for evaluation and inspection of semiconductors and semiconductor wafers
Electrical and Scientific Apparatus