Electronic apparatus, for the nondestructive testing of materials; apparatus for testing semi-finished goods and wires for material defects, surface defects and material irregularities; electronic apparatus for measuring electric, magnetic and other physical properties; electronic apparatus for measuring layer thickness, film thickness and other dimensions; probes, sensors, test heads and exploring coils for the aforesaid apparatus; electronic data processing equipment for controlling electronic apparatus, and for evaluating information therefrom; parts of the aforesaid goods; programs recorded on data carriers for controlling electronic apparatus and for evaluating information therefrom
Electrical and Scientific Apparatus