CONTACT SOLUTIONS

TEST PROBES USED IN THE AUTOMATED FAULT TESTING OF ELECTRICAL AND ELECTRONIC CIRCUITS AND CIRCUIT DEVICES, INCLUDING BARE CIRCUIT BOARD TEST PROBES, LOADED CIRCUIT BOARD TEST PROBES, SEMICONDUCTOR PROBES, TEST SYSTEM INTERFACE PROBES, WIRE HARNESS PROBES, BATTERY PROBES, HIGH CURRENT/HIGH FREQUENCY PROBES, AND SWITCH PROBES