CONTACT INTELLIGENCE

computer software sold as a feature of probe systems for processing, testing, and inspecting semiconductor wafers and integrated circuits; computer software and computer hardware sold as a feature of probe systems for processing, testing, and inspecting semiconductor wafers and integrated circuits; semiconductor testing apparatus with automated control software; probe stations, and their components, software, and accessories, for on-wafer testing of integrated circuits and semiconductors; automated process control systems, namely, computer software and computer hardware used to monitor and automate industrial machinery, namely, probe stations for on-wafer testing of integrated circuits and semiconductors