Mark Identification

CONNECTED METROLOGY

Serial Number

79404432

Filing Date

Jul 4, 2024

Trademark by

LAYTEC AKTIENGESELLSCHAFT

Classification Information

Software and framework for aggregating and combining measurement parameters of semiconductor wafers in the production of semiconductor devices; software for analysing and interpreting in-situ and in-line measurement parameters before, during and after thin film deposition, thin film etching and other treatment and characterisation steps; software for improving the yield and the stability of production processes and their analysis results for statistical process control in the production of semiconductor devices.

Electrical and Scientific Apparatus