BEDEMETRIX

MEASURING AND ANALYTICAL APPARATUS AND INSTRUMENTS AND MATERIALS CHARACTERIZATION AND MATERIALS TESTING APPARATUS AND INSTRUMENTS, NAMELY, APPARATUS AND INSTRUMENTS FOR ANALYZING AND TESTING THIN FILMS, METALLIC THIN FILMS, MULTI LAYERS, CERAMICS, SUPER CONDUCTORS AND SEMI-CONDUCTORS; POWDER, SINGLE CRYSTAL AND HIGH RESOLUTION DIFFRACTION MEASURING TOOLS; X-RAY APPARATUS AND INSTRUMENTS, NAMELY, X-RAY TUBES, X-RAY CAMERAS, X-RAY DETECTORS, DIFFRACTOMETERS, REFLECTOMETERS, AND X-RAY TOPOGRAPHY APPARATUS AND INSTRUMENTS FOR USE IN THE FIELD OF MATERIALS CHARACTERIZATION AND MATERIALS TESTING; COMPUTER HARDWARE ADAPTED FOR USE WITH THE AFORESAID; COMPUTER OPERATING SYSTEM SOFTWARE ADAPTED FOR USE WITH THE AFORESAID