AZTC

Electronic testing apparatuses for semiconductor devices, namely, test pins for testing printed circuit boards and replacement parts thereof; Electronic testing apparatuses for circuit boards, namely, test adapters for testing printed circuit boards and replacement parts thereof; Electronic testing apparatuses for semiconductor integrated circuit devices, namely, probes for testing integrated circuits; Electronic testing sockets for semiconductor devices, namely, test adaptors for testing printed circuit boards; Electronic testing probes for semiconductor integrated circuit chips, Electronic testing probes for printed circuit boards; Electronic testing probes for TAB chips, namely, chips mounted on film wired with copper foil, namely, probes for testing integrated circuits; Electronic testing probes for COF chips, namely, chips mounted on copper-plated film, namely, probes for testing integrated circuits; Electronic testing probes for semiconductor devices, namely, test adaptors for testing printed circuit boards