ASPECT
Mark Identification

ASPECT

Serial Number

88852248

Filing Date

Mar 30, 2020

Registration Date

Mar 16, 2021

Trademark by

ONTO INNOVATION INC.

Active Trademark

Classification Information

Electronic instruments for use in inspection and measurement of industrial components, namely, an automated substrate metrology device comprised of a robotic handler, automated positioning system, and optics system, all for use in determining the critical dimensions, profiles, film thickness, and composition of patterned and un-patterned films and structures used in the fabrication of integrated circuits and semiconductors

Electrical and Scientific Apparatus