AIRCOOL

electric apparatus and instruments for the examination of semiconductor wafers, namely electric wafer probe station apparatus and instruments; [ electronic measuring apparatus, namely frequency, voltage and current meters; ] electronic checking apparatus for semiconductor wafers in wafer probe stations; electronic supervision apparatus for use in wafer probe stations; signalling apparatus for faults in wafers; signalling instruments, namely [ volt meters, ammeters and thermometers; electronic laboratory instruments, namely volt meters, ammeters and thermometers; and ] scientific apparatus and instruments as laboratory and fabrication apparatus in wafer probe stations