Mark Identification

AFS-300

Serial Number

75808283

Filing Date

Sep 24, 1999

Registration Date

Aug 22, 2000

Trademark by

ADE CORPORATION

Classification Information

Substrate inspection systems, comprising computer hardware and associated software for measurement of substrates, namely, semiconductor wafers, to determine wafer flatness, shape, thickness Bow Wrap and SORI, resistivity, conductivity and notch detection

Electrical and Scientific Apparatus