73314868
Jun 15, 1981
Sep 21, 1982
Active Trademark
Testing Machinery and Equipment Used for Electrical Components and Semiconductors-, namely, Large Scale Integrated Circuit Analyzers, Very Large Scale Integrated Circuit Analyzers, Random Access Memory Circuit Analyzers, Variable Pin Capacity Semiconductor Test Stations, [ Pattern Processors for Large Scale Integrated Circuits, Pattern Processors for Very Large Scale Integrated Circuits, Pattern Processors for Random Access Memory Circuits, ] Direct Current Parametric Test Units, Direct Current Leakage Test Units, and Direct Current Loading Measurement Test Units
Electrical and Scientific Apparatus