Research, design and development of interface cards for testing; integrated circuits and semiconductor devices; Research, design and development of probes and probe cards; for testing integrated circuits and semiconductor devices; Research, design and development of sockets for testing; integrated circuits; Research, design and development of printed circuit boards; (PCBs) and electronic cards; Research, design and development of burn-in equipment for; testing semiconductors; Research, design and development of semiconductor testing; apparatus; Research, design and development of measurement apparatus and automatic equipment for testing Integrated Circuit (IC) and; semiconductor devices; Consultation on testing techniques for semiconductor,; integrated circuit, wafer and chip; Calibration of testing equipment for semiconductor, integrated; circuit, wafer and chip