Probe device for testing semiconductors; Probe device for testing integrated circuits; Software for use in operating semiconductor testing machines; Equipment for detecting and measuring failures in the manufacturing processes of semiconductors, semiconductor elements and liquid crystal; Electronic testing equipment, namely, apparatus for testing semiconductor and micro-electronic devices and circuits; Electronic testing equipment, namely, probe stations and their components and accessories for testing integrated circuits and semiconductors; Semiconductor inspection and testing equipment, namely, semiconductor wafers, reticles and photomasks; Semiconductor testing machines; all of the aforementioned used independently of a computer