Computer programs, recorded, for use in the inspection and measurement of semiconductor wafers; computer software, recorded, for use in the inspection and measurement of semiconductor wafers; precision measuring apparatus, namely, apparatus for systems inspecting and measuring semiconductor wafers, overlay metrology, and film metrology; measuring instruments, namely, instruments for inspecting and measuring semiconductor wafers, overlay metrology, and film metrology; Detectors, namely, defect detectors for semiconductor wafers; measuring apparatus, namely, apparatus for systems inspecting and measuring semiconductor wafers, overlay metrology, and film metrology; surveying apparatus and instruments; semi-conductors; video screens; optical apparatus and instruments, namely, apparatus and instruments for inspecting and measuring semiconductor systems, overlay metrology, and film metrology; optical lenses

Material testing; installation of computer software; computer software design; maintenance of computer software; technological research in the field of semiconductor testing, measuring, and inspecting; conducting technical project studies, namely yield and defect systems studies in the field of semiconductor testing, measuring, and inspecting; scientific laboratory services; research and development of new products for others; information technology (IT) support services, namely troubleshooting of computer software problems; semiconductor wafer quality testing